Celentano G., Rizzo F., Augieri A., Masi A., Barba L., Campi G., Duchenko A., Varsano F., Plaisier J.R., Gigli L., Pompeo F.V.
Rufoloni A., Celentano G., Rizzo F., Augieri A., Pompeo N., Masi A., Barba L., Duchenko A., Varsano F.
Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Ciccioli A., Augieri A., Armenio A.A., Masi A., Barba L., Duchenko A., Varsano F., Plaisier J.R., Gigli L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Campagna E., Salvato M.
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Pinto V., Domenici F., Orlanducci S., Angelis M.D., Carcione R., Palmieri D., Politi S., Tomellini M.
Ключевые слова: HTS, REBCO, coated conductors, nanodoping, nanorods, critical caracteristics, Jc/B curves, angular dependence, review
Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Meledin A., Pinto V., Feighan J., Mayer J.
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, nanodoping, nanoscaled effects, PLD process, pinning centers artificial, microstructure, X-ray diffraction, lattice parameter, critical temperature, critical caracteristics, Jc/B curves, growth rate, pinning force, temperature dependence, critical current density, angular dependence, fabrication, experimental results
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, doping effect, nanoscaled effects, defects, surface impedance, vortex dynamics, pinning, defects columnar, experimental results
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Meledin A., Pinto V., Masi A., Orlanducci S., Santoni A., Ferrarese F.M.
Ключевые слова: HTS, YBCO, films epitaxial, GdBCO, YGdBCO, fabrication, chemical solution deposition, MOD process, substrate SrTiO3, pinning centers artificial, lattice parameter, X-ray diffraction, grain size, composition, microstructure, critical caracteristics, Jc/B curves, critical temperature, irreversibility fields, temperature dependence, critical current density, angular dependence, experimental results
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., jr T.P.
Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Bianchetti M., Meledin A., Sieger M., Hдnisch J., Hьhne R., Opherden L.
Ключевые слова: HTS, REBCO, coated conductors, nanodoping, nanoscaled effects, critical caracteristics, Jc/B curves, temperature distribution, pinning force, thickness dependence, comparison, critical current density, angular dependence, microstructure, PLD process, magnetic field dependence, substrate SrTiO3
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical caracteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Bianchetti M., Armenio A.A., Meledin A., Pinto V.
Ключевые слова: HTS, YBCO, films, nanoscaled effects, nanodoping, irreversibility fields, pinning centers artificial, defects columnar, PLD process, substrate SrTiO3, microstructure, critical caracteristics, Jc/B curves, critical current density, angular dependence, pinning force, experimental results
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Silva E., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Lamanna R.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Pinto V., Frolova A.
Celentano G., Rizzo F., Augieri A., Muzzi L., Corte A.D., De Marzi G., Bragagni A., Seri M., Bagrets N., Anemona A., Bayer C., Tomassetti G.
Ключевые слова: HTS, coated conductors, buffer layers, multilayered structures, PLD process, YBCO, substrate Ni-W, substrate Cu alloy, microstructure, texture, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V.
Ключевые слова: coated conductors, HTS, aspect ratios, REBCO, substrate Cu, texture, fabrication
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Thalmaier G., Armenio A.A.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, substrate Ni-W, thickness dependence, separation layer, buffer layers, resistivity, temperature dependence
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Angrisani A.A., Colantoni I., Davoli I., Sotgiu G., Mancini R.
Galluzzi V., Gambardella U., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Saggese A., Messina G., Armenio A.A., Sabatino P., Iannone G.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Contini G., Freda R., Sotgiu G., Torokhtii K., Bemporad E.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Angrisani A.A., Colantoni I., Davoli I., Sotgiu G., Mancini R.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, fabrication, chemical solution deposition, buffer layers, MOD process, critical caracteristics, Jc/B curves
Ключевые слова: HTS, Bi2212, bulk, precursors, fabrication
Polasek A., Rizzo F., Marinkovic B.A.(bojan@dcmm.puc-rio.br), Jardim P.M., Medeiros D., Chehuan T.
Ключевые слова: HTS, Bi2223/Ag, fabrication, phase formation
Xia S.K.(sikexia@yahoo.com), Polasek A., Saleh L.A., Marinkovic B., Rizzo F., Serra E.T.
Ключевые слова: HTS, Bi2223/Ag, tapes multifilamentary, Jc/B curves, PIT process, critical caracteristics, fabrication
Rizzo F., Serra E.T., Marinkovic B.A.(bojan@rdc.puc-rio.br), Xia S., Borges H.A., Hering E.
Ключевые слова: HTS, Bi2212, bulk, phase formation, microstructure, fabrication
Rizzo F., Serra E.T., Polasek A.(polasek@cepel.br), Majewski P.
Ключевые слова: HTS, Bi2223, bulk, phase formation, heat treatment, microstructure, fabrication
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